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Ten years ago the high pin count market was relegated to PGA and CGA devices. Today BGA devices rule this market. There are plenty of challenges associated with high pin count BGA devices, but your test socket should not be one of them. In order to make sure it is not, we utilize a variety of materials and design methodologies. As I/Os creep up into the thousands, structural strength can quickly become a concern. Synergetix designs are analyzed to address the pressure concerns (i.e., 1.2 oz per pin x 2000 pins = 150 lbs in a 60 mm square) while still meeting manufacturability considerations. Read more...
Because we lead the miniaturization movement, we offer the widest line of pitches available. As these pitches continue to shrink, the mechanical challenges become extreme. Tolerances become even more critical. Because the option of aligning off the device leads is not an option on leadless devices, large perimeter and positional tolerances are often of greater concern with the QFN devices of today. Read more...
Peripheral leaded devices such as SOPs and QFPs introduce their own set of unique challenges into the testing environment. Because of these challenges, a common thought in the industry is that one could not use spring probe technology in leaded device test sockets. In the past we would have admitted that guaranteeing contact with QFPs was much more difficult than with QFNs or BGAs, but that has all changed with recent innovations at Synergetix. Read more...
A Practical Solution For 0.5mm Kelvin Testing. Every once in a while, an innovation comes along that dramatically moves the industry forward. The new Off-Set Probe fits in that category. The patent-pending 0.5 pitch Off-Set Kelvin Probe allows those test engineers involved in Kelvin testing to accurately isolate and measure resistance within 1 mΩ, while taking advantage of conventional 0.5mm DUT board designs. Read more...
Multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity. Read more...
For handler setup or hand test, a manual lid is often required as part of the test hardware set. We have refined our standard offerings so that with each socket you can receive a lid designed specifically for your application from one of five standard lid form factors. Read more...
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