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Every once in a while, an innovation comes along that dramatically moves the industry forward. The new Off-Set Probe fits in that category. The patent-pending 0.5 pitch Off-Set Kelvin Probe allows those test engineers involved in Kelvin testing to accurately isolate and measure resistance within 1 mΩ, while taking advantage of conventional 0.5 mm DUT board designs.
The key design advancement of this new probe is the beveled offset tip that allows for tighter centers, down to 0.22 mm, on the device pad. The probe tips are constructed from a revolutionary tungsten alloy that increases probe life. This tungsten alloy is 300% harder than the standard, gold plated beryllium copper as well as having a natural aversion to solder adhesion.
Most test engineers are as excited about the loadboard side of the probe as they are the device side. While shrinking the device side pitch, the loadboard remains at the standard 0.5 mm pitch. The Off-Set Kelvin Probe finally provides a production worthy solution with loadboards you can afford.
For additonal information, download our white paper:
Practical Kelvin Semiconductor Test Sockets
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